000			01656nam a22002657a 4500
003			OSt
005			20221027022709.0
008			220502b |||||||| |||| 00| 0 eng d
020			_a9781908043825
040			_cCamTech Library
041			_aeng
082			_a005.14 VOS _bVOS
092			_223
100			_aVostokov, Dmitry
245			_aSoftware trace and log analysis _bpattern reference _cDmitry Vostokov
250			_a2nd ed.
300			_a223 pages _billus., graphs. _c23 cm
520			_a General trace and log analysis patterns allow application of uniform problem detection and solving approach across diverse software environments. This pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. Pattern-oriented trace and log analysis is applicable to troubleshooting and debugging Windows, Mac OS X, Linux, FreeBSD, Android, iOS, z/OS, and any other possible computer platform. Its pattern catalog is a part of pattern-oriented software diagnostics, forensics, and prognostics developed by Software Diagnostics Institute (Dump Analysis.org + Trace Analysis.org). This reference reprints with corrections 100 patterns originally published in Memory Dump Analysis Anthology volumes 3 - 8a and Software Diagnostics Library (former Crash Dump Analysis blog, Dump Analysis.org/blog).
650			_aComputer software _xTesting
650			_aDebugging in computer science.
650			_aSoftware patterns.
843			_aPhotocopy
887			_2CamTech Library
942			_2ddc _cBK _n0
999			_c106 _d106