TY  - BOOK
AU  - Vostokov, Dmitry 
TI  - Software trace and log analysis: pattern reference
SN  - 9781908043825
U1  - 005.14 VOS 
KW  - Computer software
KW  - Testing
KW  - Debugging in computer science.
KW  - Software patterns
N2  -  	
General trace and log analysis patterns allow application of uniform problem detection and solving approach across diverse software environments. This pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. Pattern-oriented trace and log analysis is applicable to troubleshooting and debugging Windows, Mac OS X, Linux, FreeBSD, Android, iOS, z/OS, and any other possible computer platform. Its pattern catalog is a part of pattern-oriented software diagnostics, forensics, and prognostics developed by Software Diagnostics Institute (Dump Analysis.org + Trace Analysis.org). This reference reprints with corrections 100 patterns originally published in Memory Dump Analysis Anthology volumes 3 - 8a and Software Diagnostics Library (former Crash Dump Analysis blog, Dump Analysis.org/blog).
ER  -