Software trace and log analysis pattern reference Dmitry Vostokov

By:

Vostokov, Dmitry

Material type: Text

TextLanguage: English Edition: 2nd edDescription: 223 pages illus., graphs. 23 cmISBN:

9781908043825

Subject(s):

DDC classification:

005.14 VOS VOS

Summary: General trace and log analysis patterns allow application of uniform problem detection and solving approach across diverse software environments. This pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. Pattern-oriented trace and log analysis is applicable to troubleshooting and debugging Windows, Mac OS X, Linux, FreeBSD, Android, iOS, z/OS, and any other possible computer platform. Its pattern catalog is a part of pattern-oriented software diagnostics, forensics, and prognostics developed by Software Diagnostics Institute (Dump Analysis.org + Trace Analysis.org). This reference reprints with corrections 100 patterns originally published in Memory Dump Analysis Anthology volumes 3 - 8a and Software Diagnostics Library (former Crash Dump Analysis blog, Dump Analysis.org/blog).

List(s) this item appears in: STEM & ENGINEERING CORNER

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Holdings
Item type	Current library	Shelving location	Call number	Copy number	Status	Date due	Barcode
Books	CamTech Library	STEM & Engineering	005.14 VOS (Browse shelf(Opens below))	1	Available		CamTech 000057

General trace and log analysis patterns allow application of uniform problem detection and solving approach across diverse software environments. This pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. Pattern-oriented trace and log analysis is applicable to troubleshooting and debugging Windows, Mac OS X, Linux, FreeBSD, Android, iOS, z/OS, and any other possible computer platform. Its pattern catalog is a part of pattern-oriented software diagnostics, forensics, and prognostics developed by Software Diagnostics Institute (Dump Analysis.org + Trace Analysis.org). This reference reprints with corrections 100 patterns originally published in Memory Dump Analysis Anthology volumes 3 - 8a and Software Diagnostics Library (former Crash Dump Analysis blog, Dump Analysis.org/blog).

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