Software trace and log analysis (Record no. 106)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01656nam a22002657a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | OSt |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20221027022709.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 220502b |||||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781908043825 |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | CamTech Library |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 005.14 VOS |
| Item number | VOS |
| 092 ## - LOCALLY ASSIGNED DEWEY CALL NUMBER (OCLC) | |
| Edition number | 23 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Vostokov, Dmitry |
| 245 ## - TITLE STATEMENT | |
| Title | Software trace and log analysis |
| Remainder of title | pattern reference |
| Statement of responsibility, etc. | Dmitry Vostokov |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 2nd ed. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 223 pages |
| Other physical details | illus., graphs. |
| Dimensions | 23 cm |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc. | <br/>General trace and log analysis patterns allow application of uniform problem detection and solving approach across diverse software environments. This pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. Pattern-oriented trace and log analysis is applicable to troubleshooting and debugging Windows, Mac OS X, Linux, FreeBSD, Android, iOS, z/OS, and any other possible computer platform. Its pattern catalog is a part of pattern-oriented software diagnostics, forensics, and prognostics developed by Software Diagnostics Institute (Dump Analysis.org + Trace Analysis.org). This reference reprints with corrections 100 patterns originally published in Memory Dump Analysis Anthology volumes 3 - 8a and Software Diagnostics Library (former Crash Dump Analysis blog, Dump Analysis.org/blog). |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Computer software |
| General subdivision | Testing |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Debugging in computer science. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Software patterns. |
| 843 ## - REPRODUCTION NOTE | |
| Type of reproduction | Photocopy |
| 887 ## - NON-MARC INFORMATION FIELD | |
| Source of data | CamTech Library |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Source of classification or shelving scheme | Dewey Decimal Classification |
| Koha item type | Books |
| Suppress in OPAC | No |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Copy number | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Dewey Decimal Classification | CamTech Library | CamTech Library | STEM & Engineering | 05/02/2022 | 005.14 VOS | CamTech 000057 | 05/02/2022 | 1 | 05/02/2022 | Books |